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Single Photon Counting Pixel Detectors 

The cameras are for material analysis, non-destructive testing, color radiography, or radiation safety.

It senses every single particle of radiation of almost any kind, including X-rays, gamma, electrons, ions, and even neutrons.

Based on CERN technology, our cameras revolutionize a range of industries, from space to medicine.

13.5nm EUV Multilayer Mirror

This precision optical component is designed for EUV applications, specifically optimized for 13.5nm wavelength.

Featuring a multilayer coating of alternating high- and low-refractive index materials, it enhances EUV light reflection.

Ideal for EUV lithography and advanced scientific instruments, this mirror exemplifies cutting-edge EUV optics.

Vertical Laue Crystal Orientation System

A high-resolution Crystal Orientation System is the ideal tool to capture and analyse

Laue diffraction patterns from a wide range of crystalline materials.

This Laue orientation tool combines a high-resolution CCD X-ray detector,

high-brilliance X-ray beam and dedicated Laue software, delivering indexed Laue diffraction measurements

to 0.1° accuracy in seconds.

Highest efficiency Fresnel Zone Plates

- High efficiency due to material choice (Au, Ni, Si, SiO2, Ir, Cr, Diamond)

- Optimized phase shift and low absorption

- Blazed optics overcome limitations of binary optics